Skip to content
TREND Networks R164005 FiberTEK III-MM LED Kit

TREND Networks R164005 FiberTEK III-MM LED Kit

by TREND Networks
$5,339.00 - $5,339.00
$5,339.00
$5,339.00 - $5,339.00
$5,339.00
Free shipping
Extended Handling May Be Required
FiberTEK III adapters are used with LanTEK III for fast and simple certification of high bandwidth single-mode and multimode fibre optic cabling including support for encircled flux testing (optional). To pinpoint fibre cabling faults every... Read more

Overview

TREND Networks

TREND Networks R164005 FiberTEK III-MM LED Kit

FiberTEK III adapters are used with LanTEK III for fast and simple certification of high bandwidth single-mode and multimode fibre optic cabling including support for encircled flux testing (optional).
To pinpoint fibre cabling faults every FiberTEK III adapter includes a built-in visible light source to help you visually pinpoint faults and locate fibre ports.
FiberTEK III provides optical loss (dB) measurements meeting Tier 1 certification requirements.

Product Details

General Information
Brand
TREND Networks
Part Number
R164005
Product Type
Fibre Optic Tester
What's Included
2 x Multimode FiberTEK III Modules
Lockable Semi-rigid Carrying Case
2(ea.) x SC, FC, ST Adapters for Modules
SC-SC Patch Cords
6 x 50um MMF Compliant to ISO/IEC 14763-3 Standard
Quick Reference Guide
Packaging
Retail
Country of Origin
Poland
UPC
783250732937
California Residents
Proposition 65 Warning
Return Policy
NCNR - Non-Cancellable / Non-Returnable
Physical Characteristics
Weight
2.79 kg
6.15 lb
Color
Gray
Details
Features
FiberTEK III multimode (850/1300nm) kit with LED light sources for standard multimode fibre.

Compatible with all LanTEK II and LanTEK III models

Product Video

The LanTEK III is an easy to use cable certifier that meets existing TIA
and ISO/IEC performance requirements for testing up to Cat 6A/500MHz.
FiberTEK III adapters are used with LanTEK III for fast and simple
certification of high bandwidth single-mode and multimode fibre optic
cabling including support for encircled flux testing.